Microscopy – SEM, TEM and STEM

Some of the most update spectroscopy techniques include the TEM (Transmission Electron Microscope), SEM (Scanning Electron Microscope) or indeed the STEM (A combination of the Transmission and Scanning) microscopy. We have experience of delivering analysis using all the techniques.

As an example, the scanning electron microscope which is coupled with x-ray analysis (EDS) is used to examine microscopic details of surfaces and sectioned samples, to identify and analyse features of interest for a wide range of investigations:

  • metallurgical fractures and failure analysis
  • corrosion problems and evaluation of test coupons
  • surface coating evaluation and measurement
  • polymer and rubber analysis/identification
  • textiles and fibres
  • glass fragments/contaminants or foreign bodies
  • dust particulate identification

We have expertise in analysing samples for a wide range of sectors including:

  • Automotive; powertrain, valvetrain, brakes, suspension
  • Industrial; lifting equipment, hydraulics, catering
  • Oil/Gas/Power Generation
  • Medical Devices
  • Railway
  • Domestic; plumbing fittings, electrical
  • Marine
  • Electronic Devices

The LEO 435VP is a high-performance, variable pressure scanning electron microscope with a resolution of 4.0nm. Its 5 axis computer controlled stage is mounted in a specimen chamber measuring 300 x 265 x 190mm and can accommodate specimens weighing up to 0.5kg. Standard automated features include focus, stigmator, gun saturation, gun alignment, contrast and brightness.

The Oxford Isis 300 EDS system is coupled to a thin-window detector for simultaneous analysis of elements boron to uranium. The system has both qualitative and quantitative x-ray analysis capabilities, X-ray map acquisition, high-resolution digital imaging and image analysis.